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Crack Appearance Defect Detection

Light source: CF-70-W+CLD-5031-W+CC-30-W Cracked appearance defect detection, backward light using uniform surface light irradiation can reflect the transparent part of the product and the chip feature contour. Forward light using curved surface reflection of diffuse light irradiation to the product surface, to eliminate reflections, because the tunnel light in the middle of the slot reflection, so the middle part of the need for a suitable coaxial light to eliminate the spot, three light source combination, a photo can be taken once to present all the defects of the effect.
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